File:B-gf-crosssectionsemizm.png
| Uploaded by | SreeBot |
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| Upload date | 2011-12-27T12:28:25Z |
| MIME type | image/png |
| Dimensions | 1501 × 1164 px |
| File size | 285.4 KB |
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Summary
| Description |
Deutsch: Rasterelektronenmikroskop-Bild des Querschnitts zweier mittels Glaslotes (matrix, mit einem Keramik-Füllstoff, filler) verbundenen Siliziumwafers (Si), von Fraunhofer IZM. English: Microscopic cross sectional SEM images of glass frit bonded (matrix) (with a ceramic filler) silicon wafers (Si), from Fraunhofer IZM. Français : Vue par microscopie électronique à balayage (MEB) d'une section transverse de deux plaquettes (waters) de silicium (Si), assemblés par un verre de scellement (matrix) chargé de particules céramiques (filler) ; du Fraunhofer IZM. |
| Date | |
| Source | M. Petzold and C. Dresbach and M. Ebert and J. Bagdahn and M. Wiemer and K. Glien and J. Graf and R. Müller-Fiedler and H. Höfer, Fracture mechanical life-time investigation of glass frit-bonded sensors (2006) |
| Author | Uploaded by Enaswiki at en.wikipedia |
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Original upload log
Transferred from en.wikipedia to Commons by SreeBot.
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Upload date | User | Bytes | Dimensions | Comment
- 2011-03-30 11:34 (UTC) | Enaswiki | 292263 (bytes) | 1501×1164 | {{Information |Description = Microscopic cross sectional SEM images of glass frit bonded silicon wafers from Fraunhofer IZM. |Source = M. Petzold and C. Dresbach and M. Ebert and J. Bagdahn and M. Wiemer and K. Glien and J. Graf and R. Mülle