File:AFM-Raman microscope.jpg
Summary
| Description |
English: A combined system enables researchers to conduct a comprehensive characterization of materials by simultaneous mapping of chemically specific Raman bands and local topographical, mechanical, and electrical properties at nanoscale.
Raman mapping can also be obtained with nanometer resolution by means of Tip Enhanced Raman Scattering (TERS) mode. |
| Date | |
| Source | Own work |
| Author | AAMonitor96 |
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