File:Void formation.jpg
| Description |
English: Void formation in a conductor due to electromigration |
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| Source | Own work | ||
| Author | Grougrou | ||
| Permission (Reusing this file) |
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Category:Analysis
Category:Computer security
Category:Decision theory
Category:Media needing category review as of 20 October 2011
Category:Media needing category review in use at en.wikipedia
Category:Media needing category review with 4 suggested categories
Category:PD-self
Category:Self-published work
Category:Unidentified analysis