File:Tollansky.pdf
| Uploaded by | Safe cracker |
|---|---|
| Upload date | 2008-12-21T11:33:50Z |
| MIME type | application/pdf |
| Dimensions | 1583 × 1129 px |
| File size | 69.2 KB |
Summary
| Description |
English: Principle idea of Tolansky-Method for measurement of layer thickness by interferometry. |
| Date | |
| Source | Own work |
| Author | Safe cracker |
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